Brajesh Kumar Kaushik,
Sudeb Dasgupta,
Virendra Singh
VLSI Design and Test
21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers
Paperback Engels 2017 9789811074691
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Samenvatting
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Specificaties
ISBN13:9789811074691
Taal:Engels
Bindwijze:paperback
Uitgever:Springer Nature Singapore
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Inhoudsopgave
<p>Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.</p>
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