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VLSI Design and Test

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Paperback Engels 2013 2013e druk 9783642420238
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Samenvatting

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Specificaties

ISBN13:9783642420238
Taal:Engels
Bindwijze:paperback
Aantal pagina's:388
Uitgever:Springer Berlin Heidelberg
Druk:2013

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Inhoudsopgave

VLSI design.- Testing and verification.- Embedded systems.- Emerging technology.

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        VLSI Design and Test