Sleiman Bou-Sleiman,
Mohammed Ismail
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Paperback Engels 2011 2012e druk 9781441995476
Verwachte levertijd ongeveer 9 werkdagen
Samenvatting
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Specificaties
ISBN13:9781441995476
Taal:Engels
Bindwijze:paperback
Aantal pagina's:89
Uitgever:Springer New York
Druk:2012
Lezersrecensies
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Inhoudsopgave
<p>Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.</p><p>
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